TCXO STRATUM III

Temperature Compensated Xtal Oscillator - SMD Typ

Anwendungen:     
- TDM Netzwerke, SONET/SDH (STRATUM III)
  - Synchronous Equipment Timing Source
  - Wireless backhaul (Synchronous Ethernet, IEEE 1588 v2)
  - Metro carrier Ethernet, Picocells, Femtocells
Leistungsmerkmale: - Holdover stability: ±0.37 ppm over 24 hours
  - Overall stability: ±4.60 ppm including 20 years aging
  - Short term aging, G.813 Option 1: ±0.01 ppm over 24 h @+25 °C
TX7-503C-SQ-ST3
 Frequency range:  10 ~ 52 MHz
 Frequency stability:  ±4.6 ppm overall incl. 20 years aging
 Supply voltage:  2.7 V to 5.5 V
 Output signal:  CMOS
 Size:  5.2 x 3.2 mm
Frequency range:               10 ~ 52 MHz
Frequency stability: ±4.6 ppm overall incl. 20 years aging
Supply voltage: 2.7 V to 5.5 V
Output signal: CMOS
Size: 7.0 x 5.0 m
Frequency range:               10 ~ 52 MHz
Frequency stability: ±4.6 ppm overall incl. 20years aging
Supply voltage: 2.7 V to 5.5 V
Output signal: CMOS
Size: 7.0 x 5.0 mm
Frequency range:               10 ~ 32 MHz
Frequency stability: ±4.6 ppm overall incl. 20years aging
Supply voltage: 2.7 V to 5.5 V
Output signal: CMOS
Size: 7.0 x 5.0 mm
Frequency range:               10 ~ 128 MHz
Frequency stability: ±4.6 ppm overall incl. 20years aging
Supply voltage: 2.7 V to 5.5 V
Output signal: HCMOS
Size: 14.0 x 9.0 mm
Frequency range:               10 ~ 128 MHz
Frequency stability: ±4.6 ppm overall incl. 20years aging
Supply voltage: 2.7 V to 5.5 V
Output signal: HCMOS
Size: DIL 14

 

 Environmental  Reference  STD.
 Test condition
 vibration sinusoidal  IEC 60028-2-6  IEC 60679-1-5.6.7  Test Fc, 30 min per axis;
 10 Hz - 55 Hz 0.75mm, 55 Hz - 2 kHz  10g
 shock  IEC 60028-2-27  IEC 60679-1-5.6.8  Test Ea, 3x per axes 100 g,
 6 ms half-sine pulse
 solder ability  IEC 60028-2-20 
 IEC 60028-2-58
 IEC 60679-5.6.3  Test Ta (235 ±2) °C Method 1
 Test Tb Method 1A, 5s

 

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